Juli Optoelectronics (Beijing) Technology Co., Ltd
Home>Products>Quantum Efficiency Testing System for Solar Cells
Product Groups
Firm Information
  • Transaction Level
    VIP member
  • Contact
  • Phone
  • Address
    B-1311 Wanda Plaza, Tongzhou District, Beijing
Contact Now
Quantum Efficiency Testing System for Solar Cells
Quantum Efficiency Testing System for Solar Cells
Product details
detailed description:

Solar cell all-round quantum efficiency measuring instrument
Spectral response/quantum efficiency measurement system can be used to test the spectral response/quantum efficiency of various battery components, in order to improve the process and enhance conversion efficiency; In addition, this QE-R system can be equipped with transmittance and reflectance measurement kits to test the transmittance, reflectance, and internal quantum efficiency of the battery, and can be matched with various stages required by customers.

Product Features:

  • High efficiency light collection system design, with over 70% light collection, effectively improves signal strength, making measurement faster and more stable.
  • Exclusive equipped with two lock-in amplifiers, achieving real-time monitoring of light intensity and signal measurement, providing accurate measurement results.
  • Exclusive integration of computer automatic control signal switch, which can reduce maintenance and consumables costs.
  • Using original multi grating single light meter, low stray light<10-5High stability and fast scanning.
  • The light source is stable and can be tested continuously for a long time, shortening the experimental calibration time.
  • The data repeatability is as high as 99.5%.
  • Suitable for measuring solar cells of various materials.

System Description:

  • The QE-R standard system has all the necessary functions required by IEC 60904-1, 60904-7, and 60904-8:
  • The high-efficiency light collection system has a light collection effect of>70%, which is more than an order of magnitude higher than traditional lens light collection systems in terms of light intensity, providing excellent signal-to-noise ratio and measurement accuracy for the system.
  • Czerny Turner multi grating single light analyzer has low stray light<10-5, high stability, fast scanning, and a spectral range of up to 200 nm~2000 nm.
  • Dual beam optical path design:
  • Signal multiplexer, exclusively integrated with computer-controlled signal switch, avoids damage caused by pulling and pulling signal line connectors, and reduces maintenance and consumables costs.
  • The excellent signal-to-noise ratio of up to 100 dB is the result of overall system optimization. Customers do not need to read the thick operation manual of general lock-in amplifiers, nor do they need to optimize the measurement parameters themselves, avoiding the trouble and errors of human operation.
  • In DC measurement mode, customers do not need to disassemble any hardware equipment, and can directly integrate the multi power meter into the system in a modular manner, greatly simplifying hardware space and the inconvenience of disassembly and assembly.
  • High uniformity reference detector.

System specifications
project specifications
Instrument size
  1. 600 (W) x 600 (D) x 610 (H) mm integrated system, excluding homework computer
weight
  1. Subject: 80kg
measurement mode
  1. Communication measurement mode
Measuring wavelength
  1. 300nm~1100nm
Light class size
  1. 2 x 2 m2Or 1 x 4 m2(Customizable)
Integrated light source system
  1. 150WXQ light source system, light source instability<0.1%, can provide 300nm~2000nm continuous light source
  2. Efficient elliptical light collection mirror system with three-axis adjustment knob
  3. Lamp source timer
Monochromator
  1. Czerny Turner Multi Grating Single Optical Meter
  2. 0.1nm wavelength resolution, scanning range 200nm~2000nm
Automatic filter wheel
  1. Can load 6 stray light filters
  2. Can be manually/computer-controlled, with LED display
chopper circuit
  1. 4Hz~500Hz, computer-controlled frequency
Double lock-in amplifier
  1. Two DSP dual phase lock-in amplifiers are integrated into the system, which can simultaneously capture dual beam test signals
Calibration detector
  1. Si detector, 10x10m2
  2. Uneven distribution within effective area<0.5%
  3. Detection capability: 200nm~1100nm
  4. Attachment: 300nm~1100nm Spectral Response Traceability Verification Report
Signal switching multitasking device
  1. 4-on-1 computer control signal switching multitasking device
computing system
  1. PC, LCD, Windows operating system (requires personal computer desk)
software
  1. EQE/SR measurement control software
  2. Light intensity correction
  3. Multi image storage and editing
  4. Ability analysis function
  5. Automatically switch the signal between the reference detector and the battery under test
  6. Sample signal status display
  7. Internal quantum efficiency calculation (customer input reflectance)
  8. Full spectrum short-circuit circuit density calculation (automatic interleaving algorithm)
  9. Short circuit current density spectrum
  10. Spectral non degree factor calculation software (automatic interleaving algorithm)
Power demand
  1. Optional 110V or 220V AC single-phase< 1KVA
operating environment
  1. Temperature: 20 ℃~40 ℃, humidity: 20%~80%
Light intensity monitoring module
  1. 300nm~1100nm, dual beam measurement
Bias voltage
  1. 0V~±5V
Selection function
project specifications
Dual light source system
  1. Xe+QTH dual light source system, including two sets of high-efficiency elliptical spotlight systems, computer-controlled power switching
  2. 700 (W) x 700 (D) x800 (H) integrated outer box (volume after selecting dual light sources)
Biased light source
  1. 150 W white polarized light source
Fully automatic multi interface measurement kit
  1. Measurable:
  2. aa-si; au-si double-junction;
  3. aau-si; auu-si; aug-si triple-junction;
  4. III-V double-junction and triple-junction;
  5. OPV double-junction
Internal quantum efficiency measurement module
  1. 2 "Integral Ball
  2. Silicon detector, wavelength range 300 nm~1100 nm
  3. Integral ball switching mechanism
  4. Reflectivity/IQE measurement software
Penetration measurement module
  1. Penetration rate measurement detector, si 300 nm ~ 1100 nm
  2. Penetration measurement software
  3. Measurement sample stage, sample size max 20 x 20 x 3mm3(min. 10 x 10 x 1 mm3)
Long wavelength expansion kit
  1. Ge germanium reference detector, 900 nm~1800 nm with calibration report included
  2. InGaAs reference detector, 1000 nm~2000 nm with calibration report included
UPS
  1. Online UPS > 1.5 KVA
Mapping
  1. XY automatic platform, 200 nm x 200 nm stroke, 2.5 um resolution
  2. Mapping measurement software
  3. Functions such as QE scanning at any wavelength
  4. Automatic light intensity correction/sample measurement/position adjustment
other
  1. DC measurement mode, customized sample stage, digital imaging microscope needle monitoring system, internal quantum efficiency measurement of reflectivity, absorption spectroscopy measurement (reflectivity and transmittance kits need to be purchased), statistical analysis of system usage benefits, improvement analysis of manufacturing functions, power supply system analysis, 3D scanning measurement and analysis of beam induced current space scanning, multi-point EQE automatic measurement

Online inquiry
  • Contacts
  • Company
  • Telephone
  • Email
  • WeChat
  • Verification Code
  • Message Content

Successful operation!

Successful operation!

Successful operation!